Download Advanced Computing in Electron Microscopy by Earl J. Kirkland PDF

By Earl J. Kirkland

Advanced Computing in Electron Microscopy, 2d version, brings jointly assorted info on photo simulation. a useful source, this publication presents info on a number of tools for numerical computation of excessive solution traditional and scanning transmission electron microscope pictures. this article will function a useful gizmo for college students on the complicated undergraduate or graduate point, in addition to skilled researchers within the box.

This more desirable moment version comprises:

-descriptions of latest advancements within the field

-updated references

-additional fabric on aberration corrected tools and confocal electron microscopy

-expanded and more suitable examples and sections to supply superior clarity

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Press, 2003 [129] 5. J. W. Edington, Practical Electron Microscopy in Materials Science, Van Nostrand Reinhold, 1976 [87] 6. B. Fultz and J. Howe, Transmission Electron Microscopy and Diffractometry of Materials, Springer, 2001 [120] 7. C. E. Hall, Introduction to Electron Microscopy, 2nd edition, McGraw-Hill, 1966 [141] 8. P. W. Hawkes, Electron Optics and the Electron Microscope, Taylor and Francis, 1972 [148] 9. R. D. Heidenreich, Fundamentals of Transmission Electron Microscopy, Wiley, 1964 [154] 10.

The oscillatory nature of HWP (K) can cause serious problems because it is not flat and changes sign. Choosing an optimum defocus produces bands of uniform sign in the transfer function but the transfer function is still oscillating. Scherzer [311] realized that it is better to limit the range of spatial frequencies so that the transfer function at least has the same sign over its allowed range. An objective aperture is placed in the back focal plane of the objective lens (see Fig. 1) which is conveniently the Fourier transform plane.

Normalized radius R = r(Cs λ 3 )−1/4 for various values of the normalized defocus D = Δ f (Cs λ )−1/2 and objective aperture Kmax = kmax (Cs λ 3 )1/4 . 5. The total integrated current is shown as a dashed line and objective aperture. The graph has been scaled to make hADF (0) = 1. 43(Csλ 3 )1/4 . The transfer function is just the inverse Fourier transform of the point spread function. 70) The transfer function is plotted in Fig. 12 and BF-CTEM and ADF-STEM are compared in Fig. 13. It is interesting to compare an aberration corrected probe and an uncorrected probe [232].

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